Inviting disaster: lessons from the edge of technology : an inside look at catastrophes and why they happen
(Book)
Author:
Published:
New York : HarperBusiness, 2001.
Format:
Book
Edition:
1st ed.
Physical Desc:
xiv, 338 pages : illustrations ; 24 cm
Status:
Description
Description not provided
Copies
Location
Call Number
Status
Last Check-In
Bemis Lower Level
363.1 CHILES,J
On Shelf
Sep 19, 2013
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Subjects
LC Subjects
Other Subjects
More Details
Language:
English
ISBN:
0066620813, 9780066620817
Notes
Bibliography
Includes bibliographical references (pages [313]-329) and index.
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Citations
APA Citation (style guide)
Chiles, J. R. (2001). Inviting disaster: lessons from the edge of technology : an inside look at catastrophes and why they happen. New York, HarperBusiness.
Chicago / Turabian - Author Date Citation (style guide)Chiles, James R. 2001. Inviting Disaster: Lessons From the Edge of Technology : An Inside Look At Catastrophes and Why They Happen. New York, HarperBusiness.
Chicago / Turabian - Humanities Citation (style guide)Chiles, James R, Inviting Disaster: Lessons From the Edge of Technology : An Inside Look At Catastrophes and Why They Happen. New York, HarperBusiness, 2001.
MLA Citation (style guide)Chiles, James R. Inviting Disaster: Lessons From the Edge of Technology : An Inside Look At Catastrophes and Why They Happen. New York, HarperBusiness, 2001.
Note! Citation formats are based on standards as of July 2022. Citations contain only title, author, edition, publisher, and year published. Citations should be used as a guideline and should be double checked for accuracy.
Staff View
Grouped Work ID:
679a29f9-a7ee-ff9a-f255-88dd8712d6ba
Record Information
| Last Sierra Extract Time | Feb 27, 2024 11:33:14 PM |
|---|---|
| Last File Modification Time | Feb 27, 2024 11:35:11 PM |
| Last Grouped Work Modification Time | Feb 27, 2024 11:34:47 PM |
MARC Record
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| 100 | 1 | |a Chiles, James R.|0 https://id.loc.gov/authorities/names/n93030729 | |
| 245 | 1 | 0 | |a Inviting disaster :|b lessons from the edge of technology : an inside look at catastrophes and why they happen /|c James R. Chiles. |
| 250 | |a 1st ed. | ||
| 264 | 1 | |a New York :|b HarperBusiness,|c 2001. | |
| 300 | |a xiv, 338 pages :|b illustrations ;|c 24 cm | ||
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| 504 | |a Includes bibliographical references (pages [313]-329) and index. | ||
| 505 | 0 | |a Acknowledgments -- Introduction : On the machine frontier : new technology and old habits -- Shock wave : high tech on the high seas -- Blind spot : baffled and bewildered inside the massive system -- Rush to judgment : when flagship projects run out of time -- Doubtless : testing is such a bother -- Really bad day : panic and triumph on the machine frontier -- Tunnel vision : go away, I'm busy -- Red line running : humans have a limit, too -- Crack in the system : failure starts slow, but it grows -- Healthy fear : alive and alert at danger's edge -- That human touch : how little errors make big accidents -- Robbing the pillar : slacking off with the high-power system -- Machine man : surviving and thriving on the new frontier -- Disasters, calamities, and near misses cited in the book. | |
| 650 | 0 | |a Technology|x Risk assessment.|0 https://id.loc.gov/authorities/subjects/sh87002640 | |
| 650 | 6 | |a Technologie|x Évaluation du risque. | |
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